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公司名稱
台灣積體電路製造股份有限公司
工作地點
台灣
專業領域
研究發展
職別
主管職
職務類型
正職
職務張貼日
2023/09/28
The role is responsible for establishing the CD (Critical Dimension) metrology system for mask making.
職務說明
1. Define and lead vendors to develop functions for next-generation mask CDSEM.
2. Develop in-house CDSEM contour metrology for mask quality control.
3. Develop actinic metrology tool to monitor multilayer reflectivity, absorber n/k values of EUV masks, and wafer-level CD.
4. Develop the automation of metrology job preparation and data reports.
職務要求
1. Master's Degree or above in EE, CS, physics or related fields.
2. At least 3 years of hardware experiences in semiconductor metrology tools.
3. Proficiency in programming for signal and image processing.
4. Good project management, communications, organized thinking, leadership and interpersonal skills.
5. Proactive and positive attitude to deal with workplace challenges.